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IC - SMD - eSIM programming
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ISO18328-2 card test
ISO 24789-2 card test
ANSI 322 card test
Specific card test
Passport testing
ISO18745 passport test
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Smartcard and biometric card manufacturing
-- Glue tape lamination
-- Chip and biometric sensor punch
-- Card and biometric sensor milling
-- Chip and biometric sensor implanting
-- GSM-SIM punching
-- R&D lab lamination press
Smart card testing
-- CQM 2.22 card test
-- ISO 10373-1 card test
-- ISO 24789-2 card test
-- ANSI 322 card test
-- Specific card test
-- ISO 18328-2 card test
-- ELLIPSE EVC test
Specific development
--
Passport testing
-- ICAO passport test
-- Specific passport test
-- ISO18745 passport test
Programming and personalization equipment
-- IC - SMD - eSIM programming
-- Contact - dual - RFID chip programming
Products
Automatic SMD counting machine
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Semi-automatic SMD taping machine
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ELLIPSE EVC chip quality control
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ELLIPSE EVC card quality control
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Semi-automated chip and biometric sensor implanting
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A4 lamination press
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Manual GSM - SIM punch
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Automated IC - SMD - eSIM programming
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Automated desktop IC - SMD - eSIM programming
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Automatic module handler
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Chip and tag programming with punch
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Desktop lamination with punch
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3 axis RFID tester
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Card vision inspection
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Dynamic torsional stress
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Dynamic bending stress
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Shortened bending
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3 wheel test (2 cards 1 axis)
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Soft eraser rub test
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Card flexure
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Sandpaper rub test
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Wear test
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Card insertion test
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Automatic resonance frequency test
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3 wheel test
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3 wheel test (1 card 2 axes)
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3 wheel test (5 cards 2 axes)
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3 wheel test (6 cards 2 axes)
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